The Semantic Overlay Architecture for Data Interoperability and Exchange

Fajar J. Ekaputra*, Christoph Fabianek, Gabriel Unterholzer, Eduard Gringinger

*Korrespondierende*r Autor*in für diese Arbeit

Publikation: Beitrag in Buch/KonferenzbandBeitrag in Konferenzband

Abstract

Today's digital landscape is characterized by diverse encodings, syntaxes, and semantics, which forces stakeholders to dedicate considerable resources to ensure smooth data exchange and interoperability. While the W3C-recommended Resource Description Framework (RDF) offers a solid solution to these challenges, many developers find i t d aunting t han conventional data structures like JSON or YML. There have been alternative solutions suggested for data interoperability, including DLite and Layered Schemas. However, these do not fully leverage existing open standards, which diminishes their overall effectiveness. To help address this issue, we propose the Semantic Overlay Architecture (SOyA), a lightweight RDF-centric approach for data interoperability and exchange. SOyA facilitates core functionalities for data interoperability and exchange while reducing the barrier of RDF adoption. Our preliminary evaluations, focusing on roles within Knowledge Graph engineering, show encouraging outcomes. copy; 2023 IEEE.

OriginalspracheEnglisch
Titel des Sammelwerks2023 IEEE International Conference on Data and Software Engineering (ICoDSE)
Untertitel des SammelwerksToba, North Sumatera, Indonesia : 07-08 September 2023
ErscheinungsortPiscataway Township
VerlagIEEE
Seiten232-237
Seitenumfang6
ISBN (elektronisch)979-8-3503-8138-2
ISBN (Print)979-8-3503-8139-9
DOIs
PublikationsstatusVeröffentlicht - 2023
Veranstaltung2023 IEEE International Conference on Data and Software Engineering, ICoDSE 2023 - Hybrid, Toba, Indonesien
Dauer: 7 Sept. 20238 Sept. 2023

Konferenz

Konferenz2023 IEEE International Conference on Data and Software Engineering, ICoDSE 2023
Land/GebietIndonesien
OrtHybrid, Toba
Zeitraum7/09/238/09/23

Bibliographische Notiz

Publisher Copyright:
© 2023 IEEE.

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