Towards a semantic knowledge base on threats to validity and control actions in controlled experiments

Stefan Biffl; Marcos Kalinowski; Fajar Juang Ekaputra; Amadeu Anderlin Neto; Tayana Uchôa Conte; Dietmar Winkler

doi:10.1145/2652524.2652568

Towards a semantic knowledge base on threats to validity and control actions in controlled experiments

Stefan Biffl, Marcos Kalinowski, Fajar Juang Ekaputra, Amadeu Anderlin Neto, Tayana Uchôa Conte, Dietmar Winkler

Publikation: Beitrag in Buch/Konferenzband › Beitrag in Konferenzband

Originalsprache	Englisch
Titel des Sammelwerks	Proceedings of the 8th ACM-IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM '14)
Untertitel des Sammelwerks	18th and 19th September 2014, Torino, Italy
Erscheinungsort	New York
Verlag	Association for Computing Machinery (ACM)
ISBN (Print)	978-1-4503-2774-9
DOIs	https://doi.org/10.1145/2652524.2652568
Publikationsstatus	Veröffentlicht - 2014
Extern publiziert	Ja

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Biffl, S., Kalinowski, M., Ekaputra, F. J., Neto, A. A., Conte, T. U., & Winkler, D. (2014). Towards a semantic knowledge base on threats to validity and control actions in controlled experiments. in Proceedings of the 8th ACM-IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM '14): 18th and 19th September 2014, Torino, Italy ???articleNumberLabel??? 49 Association for Computing Machinery (ACM). https://doi.org/10.1145/2652524.2652568

Biffl, Stefan ; Kalinowski, Marcos ; Ekaputra, Fajar Juang et al. / Towards a semantic knowledge base on threats to validity and control actions in controlled experiments. Proceedings of the 8th ACM-IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM '14): 18th and 19th September 2014, Torino, Italy. New York : Association for Computing Machinery (ACM), 2014.

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title = "Towards a semantic knowledge base on threats to validity and control actions in controlled experiments",

author = "Stefan Biffl and Marcos Kalinowski and Ekaputra, {Fajar Juang} and Neto, {Amadeu Anderlin} and Conte, {Tayana Uch{\^o}a} and Dietmar Winkler",

year = "2014",

doi = "10.1145/2652524.2652568",

language = "English",

isbn = "978-1-4503-2774-9",

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Biffl, S, Kalinowski, M, Ekaputra, FJ, Neto, AA, Conte, TU & Winkler, D 2014, Towards a semantic knowledge base on threats to validity and control actions in controlled experiments. in Proceedings of the 8th ACM-IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM '14): 18th and 19th September 2014, Torino, Italy., 49, Association for Computing Machinery (ACM), New York. https://doi.org/10.1145/2652524.2652568

Towards a semantic knowledge base on threats to validity and control actions in controlled experiments. / Biffl, Stefan; Kalinowski, Marcos; Ekaputra, Fajar Juang et al.
Proceedings of the 8th ACM-IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM '14): 18th and 19th September 2014, Torino, Italy. New York: Association for Computing Machinery (ACM), 2014. 49.

Publikation: Beitrag in Buch/Konferenzband › Beitrag in Konferenzband

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T1 - Towards a semantic knowledge base on threats to validity and control actions in controlled experiments

AU - Biffl, Stefan

AU - Kalinowski, Marcos

AU - Ekaputra, Fajar Juang

AU - Neto, Amadeu Anderlin

AU - Conte, Tayana Uchôa

AU - Winkler, Dietmar

PY - 2014

Y1 - 2014

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U2 - 10.1145/2652524.2652568

DO - 10.1145/2652524.2652568

M3 - Contribution to conference proceedings

SN - 978-1-4503-2774-9

BT - Proceedings of the 8th ACM-IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM '14)

PB - Association for Computing Machinery (ACM)

CY - New York

ER -

Biffl S, Kalinowski M, Ekaputra FJ, Neto AA, Conte TU, Winkler D. Towards a semantic knowledge base on threats to validity and control actions in controlled experiments. in Proceedings of the 8th ACM-IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM '14): 18th and 19th September 2014, Torino, Italy. New York: Association for Computing Machinery (ACM). 2014. 49 doi: 10.1145/2652524.2652568